In the week of Dec. 5th a first analysis of the background of a sapphire substrate was performed. The measurements were performed be Evan Ryan, an undergrad working for the SADiCS project.
The graph below shows the scattering and fluorescence response of impurities within the sapphire substrate when illuminated with light at a wavelength of 375nm.
It is very important to know, at which wavelength the impurities in the substrates fluoresce, as this might interfere with the fluorescence of the Ytterbium atoms in the sample.
-ER
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